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Instrumentation and Control (I&C) Failures
- Electronic Card Failures
- Transistor Failures
- Diode Failures
- Capacitor Failures
- Contact Failures
- Microswitch Failures
- Age-Induced Failures
- Wisker Shorting
- Radioactive (EM) Interference
- Conductive Interference
- Magnetic Interference
- Inductive Interference